A Unified Channel Thermal Noise Model for Short Channel MOS Transistors

Influence of the bulk electrode on the characteristics and the channel noise of SOS-MOS transistors

2014 The channel noise current spectral density of n-type enhancement SOS-MOS transistors versus the drain-source voltage VDs exhibits a peak not only for a floating bulk electrode but also when it is grounded. In the latter case, this peak appears at higher values of VDs. This suggests the kink effect which is now masked on the D.C. characteristics IDV DS by a stronger multiplication. Theoreti...

Modeling of random channel parameter variations in MOS transistors

Widely used approaches to modeling random effects and extracting random parameters in matching-critical circuits are based upon models derived under the widely accepted premise that distributed parameter devices can be modeled with lumped parameter models. In this paper, a new stochastic approach based upon a distributed parameter model is presented that offers improvement in predicting the eff...

Short-Channel Poly-Si Thin-Film Transistors with Ultrathin Channel

The Physical Phenomena Responsible for Excess Noise in Short- Channel Mos Devices

− The physical phenomena responsible for the excess noise in shortchannel MOS devices are explained based on the non-equilibrium noise theory. Comparing the MOS excess noise with the well known excess noise in a mesoscopic conductor, it is suggested that the physical origins of both are the same. Using this theory, it is proposed that the noise sources used in the Impedance Field Method (IFM) s...

Parameter Extraction for a New Analytical Model of the Short-channel Mos Transistor

An extraction method for the parameters of a new analytical model of the submicron MOS transistor for analog applications is presented. The stages which form the extraction process are detailed, along with an original parameter extractor created in Labview, which uses the Levenberg-Marquardt fitting algorithm. Also presented are the results of the fitting of the model to experimental curves obt...